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Research Highlight 4: Imaging Mass Spectrometry and Surface Analysis by ToF-SIMS

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an excellent tool for qualitative elemental and molecular surface analysis, depth profiling, and imaging mass spectrometry. We have a ToF-SIMS IV (IONTOF) in our laboratory and use it for fast surface analysis and depth profiling of layered materials. In a collaboration with Tascon GmbH, we are also interested to push the boundaries of this technique and to develop methods for high-resolution, high-sensitivity nanoparticle detection in complex matrices.

The instrument is part of the Micro- and Nanoanalytics Facility of the University of Siegen and can be used by other trained users across the University and beyond. For details on this instrument and other available core facility instrumentation, please visit the Equipment page of the Micro- and Nanoanalytics Facility.

 

 TOF-SIMS

Image: André Silz, USI

Related Publications:

D. N. Ateacha, U. Koch, C. Engelhard*:
Direct Analysis of Alkaloids in Natural Cinchona Bark and Commercial Extracts using Time-of-Flight Secondary Ion Mass Spectrometry,
Anal. Methods, 2018, published online (DOI: 10.1039/C7AY02822A).

L. Veith*, J. Böttner, A. Vennemann, D. Breitenstein, C. Engelhard, J. Meijer, I. Estrela-Lopis, M. Wiemann*, B. Hagenhoff:
Detection of ZrO2 Nanoparticles in Lung Tissue Sections by Time-of-Flight Secondary Ion Mass Spectrometry and Ion Beam Microscopy,
Nanomaterials,
2018, 8(1), 44 (DOI: 10.3390/nano8010044).  

L. Veith*, D. Dietrich, A. Vennemann, D. Breitenstein, C. Engelhard, U. Karst, M. Sperling, M. Wiemann, B. Hagenhoff:
Combination of Micro X-Ray Fluorescencee Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry Imaging for the Marker-free Detection of NM212 CeO2 Nanoparticles in Tissue Sections,
J. Anal. At. Spectrom.
, 2018, published online (DOI: 10.1039/C7JA00325K

 
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