Lothar Veith, M. Sc.

Doctoral Student (in collaboration with Tascon GmbH)

Contact Information:

Tascon GmbH
Mendelstr. 17
D-48149 Münster
Germany

Office: 00.1.21
Phone: +49 (0)251 625622-222
Fax: +49 (0)251 625622-101
E-Mail: lothar.veith at tascon-gmbh dot de

Education:

2006	Abitur
2006-2007	Military Service
2007-2010	Bachelor of Science in Chemistry (University of Göttingen) Thesis: "Untersuchung der Interaktion von Ezrin wt und PIP2 mittels Quarzmikrowaagetechnik unter Berücksichtigung des Einflusses von Cholesterin"
2010-2012	Master of Science in Chemistry (University of Münster) Thesis: "Entwicklung von Desorptions-/ionisationsquellen für die hochauflösende Massenspektrometrie" Advisor: Prof. Engelhard
2012-2013	Doctoral student in the Institute of Inorganic and Analytical Chemistry at the University of Münster
2013-present	Doctoral student at Tascon GmbH (supervised by Prof. Engelhard, University of Siegen)

Research Interests:

Quantification approaches in Time-of-Flight Secondary Ion Mass Spectrometry, influence of matrix effects on secondary ion formation, applications of ToF-SIMS for the analysis of biological sample systems, SIMS nanostructure analysis.

Professional Experience & Interships:

2008	Internship, SGS Institute Freseniusm Taunusstein, Germany
09/2013-present	Part-time work in analytical laboratory/project support in different funded R&D Projects at Tascon GmbH, Münster, Germany

Publications:

Peer-reviewed Publications:

Oral Presentations:

International SIMS XX 2015 (Seattle, USA):
"Nanoparticle Analysis in biological Systems"

Poster Presentations:

NanoCare Clustertreffen (DaNa-Meeting) 2017 (Karlsruhe, Germany):
"ToF-SIMS Technik zur Analyse von Nanopartikeln: Geräte- und Methoden-weiterentwicklung"

19. Arbeitstagung Angewandte Oberflächenanalytik 2016 (Soest, Germany):
"Fluorescence Microscopy/ToF-SIMS Detection of Nanoparticles in Lung Tissue Sections - a Combined Approach"

25. ICP-MS Anwendertreffen 2016 (Siegen, Germany):
"Fluorescence Microscopy/ToF-SIMS Detection of Nanoparticles in Lung Tissue Sections - a Combined Approach"

7. NRW Nano-Konferenz 2016 (Münster, Germany):
"Fluorescence Microscopy/ToF-SIMS Detection of Nanoparticles in Lung Tissue Sections - a Combined Approach"

NanoCare Clustertreffen 2015 (Frankfurt am Main, Germany):
"ToF-SIMS Technik zur Analyse von Nanopartikeln: Geräte- und Methodenweiterentwicklung"

Anakon 2015 (Graz, Austria):
"Ausgewählte Sputterbedingungen für die ToF-SIMS Analyse organischer/anorganischer Mischsysteme"

NanoCare Clustertreffen 2015 (Frankfurt am Main, Germany):
"ToF-SIMS Analytik in der Nanotoxikologie"

SIMS Europe 2014 (Münster, Germany):
"Selection of sutter ion for dynamic depth profiling of Lithium ion based battery electrodes"

Aktualisiert via XIMS am 27.2.2018 von C. Engelhard